Viewing page 134 of 170

This transcription has been completed. Contact us with corrections.

(3) keep track of FTO's not accomplished (e.g. S TRK threshold FTO, on this sim)

(4) record data voiced down in the CAP

(5) T/P test messages....make sure it's  working -- otherwise send up block data on text.

(6) "critical formats" are backgrounds for certain SPEC's which are contained in the DEU load not the GPC. BFS DEU IPL, or bad DEU load, could mean these aren't loaded.

(7) IMU BITE T: IMU T not monitored directly by ground, but is inferred by degraded performance & BITE T.

[[Left margin]] FDF [[/Left margin]]

(8) FDF: why not close LG ISOL VLVS 2 & 3 after the 3 system interaction test, instead of leaving them open throughout single system test (sys 1)

(9) failed CRT SEL switch -- couldn't be differentiated from failed L KYBD or failed DEU

(10) CRT management: don't get down to 1 CRT ......

(11) FA1 elements C&D lost => parameters input to GPC are not sent on request
     [go through flight rules to determine minimum mission]
     Add to procedure: securing of L RCS (VRCS RM lost)

(12) Freon loop signal conditioner ↓ -- lost insight into loop 2 -- should have had higher priority.

(13) when MF switched, CRT's look at NBAT

Transcription Notes:
S TRK is correct. Went to a NASA website to check it out. DEU [not DEV] is Display Electronics Unit (on NASA website). Compare "U" with "V" in VLVS. I believe FTD is actually FTO (perhaps Flight Test Objective).